Guest-Edited by Dr. James Truchard, National Instruments

• Automated Test Outlook 2017, Through the Eyes of NI's Cofounder: A Special Issue Guest - Edited by Dr. James Truchard

  Staff National Instruments

  In this special edition white paper, NI Cofounder Dr. James Truchard reflects on the past 40 years of test and measurement, identifies market and technology trends impacting today's test organizations, and looks forward to what lies ahead.